Description
The JEOL 2100F is a transmission electron microscope (TEM) which is operated in both TEM and scanning-TEM (STEM) configurations. The JEOL 2100F is equipped with a 200 kV Schottky field emission gun, and a CEOS aberration corrector for the probe-forming optics to correct for aberrations up to the third-order. The JEOL 2100F is equipped with a new Gatan Rio 16 CMOS camera for TEM bright field and dark field imaging, and is capable of acquiring 1k x 1k images at 160 frames per second. For chemical and compositional analysis, the JEOL 2100F is equipped with a windowless energy dispersive x-ray spectroscopy (EDS) system and a post-column Gatan imaging filter (GIF).
Specifications
- Accelerating voltage: 200 kV
- Spatial resolution (HRTEM): 2.3 Å (point-to-point)
- Spatial resolution (STEM): 1.0 Å
- Energy resolution: 0.7 eV
Capabilities
Imaging
- Transmission Electron Microscopy (TEM)
- Bright Field Imaging (BF TEM)
- Diffraction Contrast (TEM BF and Dark Field)
- Weak-Beam Imaging
- Selected Area Electron Diffraction (SAED).
- Aberration-corrected Scanning Transmission Electron Microscopy (STEM)
- High-angle Annular Dark Field Imaging (HAADF-STEM)
- Bright Field STEM (BF STEM)
In-situ Holders
- Electrical testing and micro-manipulation (STM-TEM)
- Combined heating (1200°C) and biasing (Protochips Aduro)
- Cryo-electron microscopy (liquid N₂).
- Heating up to 1000°C (Gatan heating).
Analytical
- Energy-filtered TEM (EF-TEM) and Electron Energy Loss Spectroscopy (EELS) with Gatan Tridem GIF
- Energy-dispersive x-ray spectroscopy (EDS) with Oxford X-MaxN TSR EDS detector.
Location
113 Kemper Hall.